Typical Electron Microscope Investigations by J.W. Edington
By J.W. Edington
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The presence of streaks in the SADP lying in directions in the basal plane of the Cr7 C 3 crystal structure is interpreted in terms of stacking faults planes on and perpendicular to the basal plane by Dyson and Andrews (1969), that is {0001} and {11~0}. Beech and Warrington (1966) have used this characteristic streaking as a means of distinguishing this carbide from others. 2 The Determination ofthe Burgers Vector of Partial Dislocations in MAR-M-200 (after B. H. 5 application of conventional invisibility criteria to the determination of the direction of bP for partial dislocations presents considerable difficulty.
Oloc . . I•-;•-::::w . . ,. . b(' \ \ \ -b- ............... ............. [115]a. (IOI]c 321a. -• /"'/ ...... ~ ....... / (e l (b) ............ <(...... \ ................... ', 4Ti"'~ . . \ \ \ ....... \ _I 1•-. _ . . 1 'J. :_c I . . ...... \ . . . . ~·-. .............. tf-JoiOc ............. _ [l i5]"' [ioi]c "' (c) ' i 1og)o. ,~. 321 't:r..... [012](1. 38(a) (121)J/(TI2)c. 39(a) the (121)" and (I21)" reflections are shown on the great circle of the [012]" zone is then projected to the centre of the stereogram and the (121), and (tLl), positions project to the positions (1Ll)"P and (I21)"P on the principal circle.
19(c). Because the particle thickness is so small, very few particles intersected the surface and the correction need not be applied. 19(d) shows the size distribution so obtained and it is close to the corrected line for edge-on particles (solid line). The discrepancy in the two methods is 15% in Nv and 3% in D. In this case, D "' t for jj < t the accuracy would be greater because of the smaller correction. The calculation of D, Nv, Av and V can best be illustrated by considering a specific example.