Soft Errors in Modern Electronic Systems (Frontiers in by Michael Nicolaidis
By Michael Nicolaidis
This publication offers a complete presentation of the main complex learn effects and technological advancements permitting knowing, qualifying and mitigating the tender mistakes impact in complicated electronics, together with the elemental actual mechanisms of radiation triggered delicate error, many of the steps that result in a process failure, the modelling and simulation of soppy errors at a number of degrees (including actual, electric, netlist, occasion pushed, RTL, and method point modelling and simulation), fault injection, speeded up radiation trying out and ordinary setting checking out, tender mistakes orientated try out buildings, process-level, device-level, cell-level, circuit-level, architectural-level, software program point and approach point smooth errors mitigation thoughts. The ebook encompasses a accomplished presentation of newest advances on figuring out, qualifying and mitigating the tender mistakes impression in complex digital structures, offered by means of academia and specialists in reliability, fault tolerance, EDA, processor, SoC and approach layout, and particularly, specialists from industries that experience confronted the smooth mistakes effect by way of product reliability and similar enterprise concerns and have been within the leading edge of the countermeasures taken by way of those businesses at a number of degrees for you to mitigate the gentle mistakes results at a price applicable for advertisement items. In a quick relocating box, the place the influence on floor point electronics is especially fresh and its severity is progressively expanding at each one new technique node, impacting one after one other quite a few sectors (as an instance, the automobile Electronics Council involves submit qualification necessities on tender errors), examine and know-how advancements and business practices have evolve very speedy, outdating the newest books edited at 2004.
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Additional resources for Soft Errors in Modern Electronic Systems (Frontiers in Electronic Testing)
Example text
The flux of particles varies with altitude, latitude, and to a lesser extent with longitude. The particles have a broad energy spectrum and present several interaction mechanisms that result in energy deposition in the materials. Some impurities present in semiconductors or package materials are radioactive and emit alpha particles that can reach sensitive zones. In electronic devices, single particles may deposit enough ionizing energy to upset components. To understand SEEs, the particle interaction mechanisms must be quantified and the recoils that are produced by the nuclear spallation reactions must be well identified by their nature, energy, and direction.
Silicon recoil Range (µm) 6 5 4 3 2 1 0 0 1 2 3 4 5 Energy (MeV) Fig. 2 35 Velocity of Ions In the energy range of recoils produced by atmospheric neutrons, classical theory can apply and the velocity is related to energy by v ¼ SQRT(2E/m) with m ¼ A Â AMU, A being the atomic number and AMU the Atomic Mass Unit. 66054 Â 10À27 Kg. 47 mm/ps. 4 Ionization Ionization is due to coulomb interaction with the electrons of silicon atoms of the recoil ions with effective charge Zeff. High energy electrons (d rays) are created which lose their energy by further ionization or phonon excitation in times of 1–100 fs.
Therefore, compiling the knowledge cumulated in an abundant literature, and reporting the open issues and ongoing efforts, is a challenging task. Such a tentative should start by discussing the fundamental aspects of SEEs before reviewing the different steps that are necessary for creating comprehensive prediction models and developing efficient mitigation techniques. SEE occurs when the charge resulting from the carriers (holes and electrons) liberated by an ionizing particle (heavy ion, alpha particle, recoils of nuclear interaction between a neutron and an atom of the die, .