Electron Diffraction in the Electron Microscope by J.W. Edington

Electron Diffraction in the Electron Microscope by J.W. Edington

By J.W. Edington

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This step is not essential (see footnote on previous page) but will be found to be QQ! 1. 51(a) of an Fe-Si-Ti alloy aged for 16 hours at 600 oc and may be used as an example of an orientation relationship determination. c. c. 714 A) . The zone axes of the patterns are [ITOJa-iron and [IIO]Fe 2 ns; and the (002) reflecting planes in both phases are parallel. 39(c) with the important poles located. ). The equivalent superimposed stereograms are shown in (b) [Courtesy of D . Jack] This orientation relationship was checked for consistency using other diffraction patterns from this area with different B in the matrix [100] and [111 ], see point (4) above .

31(a), (b). 31{c), (d). 31(c), (d). The 180° ambiguity may be removed as follows. 2). 1(b)) . This is equivalent to determining in which unit triangle B lies using a Kikuchi map. 22 B lies between [126] and [1 I3]. , 1964; Vaughan and Silcock, 1967). The procedure is as follows. c. c. materials. (2) Tilt a known amount in a known direction until a simple recognisable diffraction pattern is 29 Electron Diffraction in the Electron Microscope d irection of motion of K1kuch1 lmes ~ tilt (ol 420 o~is (b) 420 331 iii· .

40(b) with [0001] lying on [111] and [I2IO] lying on [I10]. 40(a). Clearly only ±(2021) and ±(I2IO) reflections occur lying parallel to (001) and (IlO) reflecting planes. When the interplanar spacing of these w reflections is taken into account, the position of the ±(2021) and ±(I2IO) spots may be drawn and it is found they superimpose on (002) and (Il 0) matrix reflections. 40(d). The spots from the remaining variants may be 2201 Prediction of SADP is a particularly important part of analysis of complex situations.

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